Si. Bozhevolnyi et al., DIRECT OBSERVATION OF LOCALIZED DIPOLAR EXCITATIONS ON ROUGH NANOSTRUCTURED SURFACES, Physical review. B, Condensed matter, 58(17), 1998, pp. 11441-11448
Using a photon scanning tunneling microscope (operating alternatively
at the wavelengths of 594 and 633 nm) with shear-force feedback we ima
ge the topography of silver colloid fractals simultaneously with a nea
r-field intensity distribution. We observe that near-field optical ima
ges exhibit spatially localized (within 150-250 nm) intensity enhancem
ent by one to two orders of magnitude. These bright light spots are fo
und to be sensitive to the light wavelength, polarization, and angle o
f incidence. We relate the observed phenomenon to the localization of
resonant dipolar excitations in random nanostructured aggregates. [S01
63-1829(98)06941-0].