Ai. Belogorokhov et al., OPTICAL CHARACTERIZATION OF POROUS SILICON EMBEDDED WITH CDSE NANOPARTICLES, Applied physics letters, 73(19), 1998, pp. 2766-2768
Arrays of a few nanometer-size clusters have been realized using a por
ous silicon (PS) matrix by filling its pores with CdSe. The photolumin
escence (PS) peak from the embedded area of the PS samples with differ
ent luminescence stabilizes at 1.79 eV. This has been interpreted as d
ue to emission from the CdSe clusters with an average size of about 3-
5 nm. Likewise, the PL and Raman scattering spectra of the pure PS are
a of the samples have been compared with those obtained from the embed
ded areas. PL spectra were examined as a function of laser irradiation
. Finally, to analyze the possibility of the formation of metal/porous
semiconductor contacts, cross-section structures have been observed b
y scanning electron microscopy in the electron-beam-induced current mo
de. (C) 1998 American Institute of Physics. [S0003-6951(98)00445-8].