OPTICAL CHARACTERIZATION OF POROUS SILICON EMBEDDED WITH CDSE NANOPARTICLES

Citation
Ai. Belogorokhov et al., OPTICAL CHARACTERIZATION OF POROUS SILICON EMBEDDED WITH CDSE NANOPARTICLES, Applied physics letters, 73(19), 1998, pp. 2766-2768
Citations number
12
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
73
Issue
19
Year of publication
1998
Pages
2766 - 2768
Database
ISI
SICI code
0003-6951(1998)73:19<2766:OCOPSE>2.0.ZU;2-2
Abstract
Arrays of a few nanometer-size clusters have been realized using a por ous silicon (PS) matrix by filling its pores with CdSe. The photolumin escence (PS) peak from the embedded area of the PS samples with differ ent luminescence stabilizes at 1.79 eV. This has been interpreted as d ue to emission from the CdSe clusters with an average size of about 3- 5 nm. Likewise, the PL and Raman scattering spectra of the pure PS are a of the samples have been compared with those obtained from the embed ded areas. PL spectra were examined as a function of laser irradiation . Finally, to analyze the possibility of the formation of metal/porous semiconductor contacts, cross-section structures have been observed b y scanning electron microscopy in the electron-beam-induced current mo de. (C) 1998 American Institute of Physics. [S0003-6951(98)00445-8].