STRUCTURAL AND OPTICAL ANALYSIS OF EPITAXIAL GAN ON SAPPHIRE

Citation
U. Straub et al., STRUCTURAL AND OPTICAL ANALYSIS OF EPITAXIAL GAN ON SAPPHIRE, Semiconductor science and technology, 12(5), 1997, pp. 637-644
Citations number
23
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Condensed Matter","Material Science
ISSN journal
02681242
Volume
12
Issue
5
Year of publication
1997
Pages
637 - 644
Database
ISI
SICI code
0268-1242(1997)12:5<637:SAOAOE>2.0.ZU;2-1
Abstract
We investigate epitaxial layers of GaN on c-plane sapphire by photolum inescence, optical density and x-ray diffraction. Besides the well kno wn luminescence from hexagonal GaN we have identified two emission ban ds from cubic GaN. We observe the emission of the donor bound exciton in cubic GaN at 3.279 eV. The luminescence at 3.15-3.21 eV is explaine d as the cubic donor-acceptor recombination. The corresponding accepto r binding energy is found to be low as E-A less than or equal to 100 m eV. For layers of 400 nm thickness, the optical density yield values f or the average contents of cubic GaN between 10 and 25%. Proper growth conditions minimize the cubic contents in the upper regions of such l ayers.