Vf. Agekyan et al., OPTOELECTRONIC PHENOMENA IN GAAS AND GAP LAYERS PREPARED BY NITROGEN TREATMENT, Semiconductors (Woodbury, N.Y.), 32(10), 1998, pp. 1075-1076
Plasma processing of single-crystal wafers of gallium arsenide and gal
lium phosphide is employed to obtain thin wideband layers. The spectra
l dependence of the photoluminescence of the layers and of the photose
nsitivity of the corresponding layer/substrate structures is investiga
ted. An analysis of the results of these studies gives us reason to be
lieve that the described process leads to replacement of arsenic and p
hosphorus atoms by nitrogen and to the formation of wideband layers of
solid solutions on the surface of the indicated semiconductors. (C) 1
998 American Institute of Physics. [S1063-7826(98)01310-6].