OPTOELECTRONIC PHENOMENA IN GAAS AND GAP LAYERS PREPARED BY NITROGEN TREATMENT

Citation
Vf. Agekyan et al., OPTOELECTRONIC PHENOMENA IN GAAS AND GAP LAYERS PREPARED BY NITROGEN TREATMENT, Semiconductors (Woodbury, N.Y.), 32(10), 1998, pp. 1075-1076
Citations number
3
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
10637826
Volume
32
Issue
10
Year of publication
1998
Pages
1075 - 1076
Database
ISI
SICI code
1063-7826(1998)32:10<1075:OPIGAG>2.0.ZU;2-E
Abstract
Plasma processing of single-crystal wafers of gallium arsenide and gal lium phosphide is employed to obtain thin wideband layers. The spectra l dependence of the photoluminescence of the layers and of the photose nsitivity of the corresponding layer/substrate structures is investiga ted. An analysis of the results of these studies gives us reason to be lieve that the described process leads to replacement of arsenic and p hosphorus atoms by nitrogen and to the formation of wideband layers of solid solutions on the surface of the indicated semiconductors. (C) 1 998 American Institute of Physics. [S1063-7826(98)01310-6].