PHOTOELECTRIC PROPERTIES OF GAN GAP HETEROSTRUCTURES/

Citation
Vm. Botnaryuk et al., PHOTOELECTRIC PROPERTIES OF GAN GAP HETEROSTRUCTURES/, Semiconductors (Woodbury, N.Y.), 32(10), 1998, pp. 1077-1079
Citations number
14
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
10637826
Volume
32
Issue
10
Year of publication
1998
Pages
1077 - 1079
Database
ISI
SICI code
1063-7826(1998)32:10<1077:PPOGGH>2.0.ZU;2-X
Abstract
Thin interference layers of n-GaN were grown on n- and p-type GaP subs trates with (100) and (111) orientations by vapor phase epitaxy in an open chloride system. Photosensitivity spectra of isotypic and anisoty pic heterojunctions under linear polarized light from the side of the wideband component (GaN) at oblique incidence were investigated. Induc ed polarized photosensitivity was observed, and peculiarities of this photosensitivity caused by interference in the GaN layers are discusse d. (C) 1998 American Institute of Physics. [S1063-7826(98)01410-0].