R. Schmeling et al., MULTIELEMENT ANALYSIS BY TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY FOR THE CERTIFICATION OF LICHEN RESEARCH MATERIAL, Fresenius' journal of analytical chemistry, 357(8), 1997, pp. 1042-1044
Total reflection X-ray fluorescence spectrometry was applied for the c
ertification of IAEA lichen-336. The elements Ca, Mn, Fe, Cu, Zn, Rb,
Sr and Pb were determined simultaneously. The concentrations range fro
m 1.8 mg/kg for Rb to 2360 mg/kg for Ca. The results were compared wit
h those of other methods and laboratories having participated in this
certification for the International Atomic Energy Agency (IAEA): emiss
ion spectrometry, mass spectrometry, atomic absorption spectrometry X-
ray spectrometry. neutron activation analysis and voltammetry. The res
ults determined by TXRF are in good agreement with the overall means o
f accepted values and differ from the means by to 10%.