MULTIELEMENT ANALYSIS BY TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY FOR THE CERTIFICATION OF LICHEN RESEARCH MATERIAL

Citation
R. Schmeling et al., MULTIELEMENT ANALYSIS BY TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY FOR THE CERTIFICATION OF LICHEN RESEARCH MATERIAL, Fresenius' journal of analytical chemistry, 357(8), 1997, pp. 1042-1044
Citations number
10
Categorie Soggetti
Chemistry Analytical
ISSN journal
09370633
Volume
357
Issue
8
Year of publication
1997
Pages
1042 - 1044
Database
ISI
SICI code
0937-0633(1997)357:8<1042:MABTXS>2.0.ZU;2-Z
Abstract
Total reflection X-ray fluorescence spectrometry was applied for the c ertification of IAEA lichen-336. The elements Ca, Mn, Fe, Cu, Zn, Rb, Sr and Pb were determined simultaneously. The concentrations range fro m 1.8 mg/kg for Rb to 2360 mg/kg for Ca. The results were compared wit h those of other methods and laboratories having participated in this certification for the International Atomic Energy Agency (IAEA): emiss ion spectrometry, mass spectrometry, atomic absorption spectrometry X- ray spectrometry. neutron activation analysis and voltammetry. The res ults determined by TXRF are in good agreement with the overall means o f accepted values and differ from the means by to 10%.