C. Dubourdieu et al., THE COMPOSITION ANALYSIS OF YBA2CU3O7-DELTA OR PRBA2CU3O7-DELTA THIN-FILMS AND (YBA2CU3O7-DELTA PRBA2CU3O7-DELTA)(N) HETEROSTRUCTURES PREPARED BY CVD/, Fresenius' journal of analytical chemistry, 357(8), 1997, pp. 1061-1065
Some YBa2Cu3O7-delta films and heterostructures prepared by Chemical V
apor Deposition (CVD) were analyzed in our laboratories by EPMA-EDX or
WDX, RES, SNMS and AES. It was found that in some cases the results o
f composition analysis can significantly deviate from each other. At l
east two main reasons for these deviations exist: the different latera
l resolution and the application of different reference samples for th
e calibration.