SUBSTRATE STRAIN-INDUCED CRYSTALLOGRAPHIC TEXTURE IN SPUTTERED VANADIUM METAL-FILMS

Citation
Mg. Krishna et al., SUBSTRATE STRAIN-INDUCED CRYSTALLOGRAPHIC TEXTURE IN SPUTTERED VANADIUM METAL-FILMS, Journal of materials research, 13(11), 1998, pp. 3221-3226
Citations number
28
Categorie Soggetti
Material Science
ISSN journal
08842914
Volume
13
Issue
11
Year of publication
1998
Pages
3221 - 3226
Database
ISI
SICI code
0884-2914(1998)13:11<3221:SSCTIS>2.0.ZU;2-2
Abstract
The effects of varying surface strain of glass substrates on the cryst allographic texture of vanadium metal thin films are reported. The str ain on a soda glass surface can be varied as a function of duration of exchanging the Na ions with larger ions, K, Rb, and Cs. The films, wh ich are oriented in the (110) direction on unstrained glasses, pass th rough a region of completely random orientation as the strain on the s ubstrates increases and regain the (110) orientation as substrate stra in relaxation occurs. The magnitude of relaxation and, therefore, the preferred (110) orientation is ion-size dependent. This behavior is du e to the change in total surface energy and provides experimental mean s for demonstrating the effects of surface energy on the crystalline e volution of thin films.