PHOTOREFRACTIVE COHERENCE-GATED INTERFEROMETRY

Citation
A. Shiratori et M. Obara, PHOTOREFRACTIVE COHERENCE-GATED INTERFEROMETRY, Review of scientific instruments, 69(11), 1998, pp. 3741-3745
Citations number
15
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
ISSN journal
00346748
Volume
69
Issue
11
Year of publication
1998
Pages
3741 - 3745
Database
ISI
SICI code
0034-6748(1998)69:11<3741:PCI>2.0.ZU;2-Z
Abstract
We have demonstrated a novel optical interferometric technique for a h ighly scattering environment, using photorefractive coherence gating. A two-wave mixing process in a photorefractive barium titanate crystal effectively reduces scattering noise, and we have successfully detect ed interferometric signals through scattering media of up to 17 mfp, w ith a high visibility. We have also demonstrated a two-dimensional thi ckness measurement of an optically scattering thin film using our new interferometry. (C) 1998 American Institute of Physics. [S0034-6748(98 )01911-X].