HIGH-RESOLUTION ELECTRON TIME-OF-FLIGHT APPARATUS FOR THE SOFT-X-RAY REGION

A gas-phase time-of-flight (TOF) apparatus, capable of supporting as m any as six electron-TOF analyzers viewing the same interaction region, has been developed to measure energy- and angle-resolved electrons wi th kinetic energies up to 5 keV. Each analyzer includes a newly design ed lens system that can retard electrons to about 2% of their initial kinetic energy without significant loss of transmission; the analyzers can thus achieve a resolving power (E/Delta/E) greater than 10(4) ove r a wide kinetic-energy range. Such high resolving power is comparable to the photon energy resolution of state-of-the-art synchrotron-radia tion beamlines in the soft x-ray range, opening the TOF technique to n umerous high-resolution applications. In addition, the angular placeme nt of the analyzers, by design, permits detailed studies of nondipolar angular distribution effects in gas-phase photoemission. (C) 1998 Ame rican Institute of Physics. [S0034-6748(98)03611-9].