CONSTRUCTION OF A DUAL-MODE SCANNING NEAR-FIELD OPTICAL MICROSCOPE BASED ON A TAPPING MODE ATOMIC-FORCE MICROSCOPE

We present the modification of a commercial tapping mode atomic force microscope into a reflection and transmission dual mode scanning near- field optical microscope. In the configuration, the normal force detec tion unit is replaced by a shear force detection module and an interfa cing circuit. The tip-sample distance control is therefore similar to tapping mode operation. Detection of the near-field signals is based o n photodiodes and the lock-in technique, and the resolutions obtained for the topography and the near-field signal are around 80 and 150 nm, respectively. (C) 1998 American Institute of Physics. [S0034-6748(98) 04911-9].