LOW-TEMPERATURE ELECTRICAL-RESISTANCE OF THE U(CU, NI)(4)AL-8 SYSTEM AND MAGNETIC AND ELECTRICAL-PROPERTIES OF SCCU4-X(XAL8)

The electrical resistance measurements of the UCu4-xNixAl8 were perfor med in the temperature range 30 mK-4.2 K. Also the samples without Ni but with various Al/Cu ratio were investigated. All these compounds ex hibit strong decrease in R(T) plot below 1 K which results from a pres ence of CuAl2 as impurity. The ScCu4+xAl8-x alloys exist as the single -phase materials for the composition range 0 less than or equal to x l ess than or equal to 2.15. At low temperatures the alloys are weakly p aramagnetic whereas at higher temperatures weakly diamagnetic properti es are observed. Their electrical resistivity is low and weakly temper ature depenedent. No anomalies in both chi(T) and rho(T) plots can be detected.