SEM AND X-RAY-ANALYSIS OF SURFACE MICROSTRUCTURE OF A NATURAL LEATHERPROCESSED IN A LOW-TEMPERATURE PLASMA

Citation
Yn. Osin et al., SEM AND X-RAY-ANALYSIS OF SURFACE MICROSTRUCTURE OF A NATURAL LEATHERPROCESSED IN A LOW-TEMPERATURE PLASMA, Vacuum, 51(2), 1998, pp. 221-225
Citations number
1
Categorie Soggetti
Physics, Applied","Material Science
Journal title
VacuumACNP
ISSN journal
0042207X
Volume
51
Issue
2
Year of publication
1998
Pages
221 - 225
Database
ISI
SICI code
0042-207X(1998)51:2<221:SAXOSM>2.0.ZU;2-K
Abstract
The plasma processing of natural leather by exposure to a non-equilibr ium low temperature plasma was done for different plasma regimes. An S EM investigation of the structure and X-ray phase measurements of surf ace layers on the processed leather are reported. It was established t hat the changes of morphology and phase composition of the leather sur face layers arose from crystallization of an organic phase that depend ed on the plasma processing times. The present results represent the p ractical importance for perfection of technology of manufacturing and processing of leather under plasma conditions. (C) 1998 Published by E lsevier Science Ltd. All rights reserved.