We have grown thin stable films of a good metal, Ag, that have charact
eristics of bad metals: high resistivity, strong temperature dependenc
e of resistivity, and lack of resistive saturation. For films of diffe
rent thickness. the temperature-dependent resistance and the Hall effe
ct resistance provide evidence that the apparent bad metallicity is a
consequence of the microstructure of the film rather than the result o
f new physics. This microstructure, which we characterize with scannin
g probe techniques, occurs on length scales comparable to the mean fre
e path, thereby changing the sign of the classical magnetoresistance f
rom positive to negative, [S0031-9007(98)07453-5].