The properties of films of rare earth metal oxides obtained by evapora
tion of the metal in an oxygen atmosphere are given. The deposits were
highly dispersed and crystallized with a cubic type-Mn2O3 structure.
The data obtained include. width of the forbidden band (4-6 eV), refra
ctive index (1.89-2. 05), specific electrical resistance (10(14)-10(15
) Omega.cm), breakdown voltage (10(6)-10(7) V/cm), etc. It is shown th
at films of REM oxides are promising as passive elements of microcircu
its, transparent coatings, temperature and heat-flow sensors. These ex
amples by far do nor exhaust the possibilities for use of such films.