UV-LASER ABLATION SPECTROSCOPY IN ELEMENT ANALYSIS OF SOLID-SURFACE

Citation
Y. Oki et al., UV-LASER ABLATION SPECTROSCOPY IN ELEMENT ANALYSIS OF SOLID-SURFACE, Optical review, 5(4), 1998, pp. 242-246
Citations number
7
Categorie Soggetti
Optics
Journal title
ISSN journal
13406000
Volume
5
Issue
4
Year of publication
1998
Pages
242 - 246
Database
ISI
SICI code
1340-6000(1998)5:4<242:UASIEA>2.0.ZU;2-7
Abstract
Laser ablation for the atomic emission spectroscopy of a glass sample is studied using pulsed UV laser systems and the effect of the laser w avelength is investigated. The threshold fluence for ablation is decre ased and the detection sensitivity is improved for shorter wavelengths . Furthermore, very thin (less than 1 nm/shot) surface slicing is poss ible at a wavelength as short as 193 nm. Polymers also show good ablat ion characteristics. Improvement of sensitivity and spatial resolution by using shorter wavelength laser ablation is discussed for Na detect ion in a glass sample.