E. Huang et al., USING SURFACE-ACTIVE RANDOM COPOLYMERS TO CONTROL THE DOMAIN ORIENTATION IN DIBLOCK COPOLYMER THIN-FILMS, Macromolecules, 31(22), 1998, pp. 7641-7650
The structure of thin films of a symmetric diblock copolymer, P(dS-b-M
MA) (dS = perdeuterated styrene, MMA = methyl methacrylate), was inves
tigated near preferential and nonpreferential (neutral) surfaces. Neut
ral surfaces were achieved at the substrate and air interfaces by loca
lizing random copolymer, P(S-r-MMA), having a styrene fraction of 0.60
, to each of these interfaces. This was performed by chemically grafti
ng the random copolymer to the substrate and anchoring a surface activ
e random copolymer having a perfluorinated end group to the air interf
ace, respectively. Neutron reflectivity and small-angle neutron scatte
ring were used to determine the orientation of the lamellar microdomai
ns for films having various boundary conditions. Successive steps of C
F4 reactive ion etching followed by field emission scanning electron m
icroscopy were used to ascertain the orientation of the microdomains a
s a function of film depth. For films confined between two continuous
neutral surfaces, the orientation of the lamellar microdomains is obse
rved to be perpendicular to the film surfaces throughout the entire fi
lm thickness.