CHARGE STABILITY OF PULSED-LASER DEPOSITED POLYTETRAFLUOROETHYLENE FILM ELECTRETS

Authors
SCHWODIAUER R GOGONEA SB BAUER S HEITZ J ARENHOLZ E BAUERLE D
Citation
R. Schwodiauer et al., CHARGE STABILITY OF PULSED-LASER DEPOSITED POLYTETRAFLUOROETHYLENE FILM ELECTRETS, Applied physics letters, 73(20), 1998, pp. 2941-2943
Citations number
22
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
73
Issue
20
Year of publication
1998
Pages
2941 - 2943
Database
ISI
SICI code
0003-6951(1998)73:20<2941:CSOPDP>2.0.ZU;2-K
Abstract
Pulsed-laser deposited (PLD) polytetrafluoroethylene (Teflon-PTFE) fil ms from press-sintered targets are found to be highly crystalline, wit h spherulite sizes adjustable over more than one order of magnitude by suitable thermal annealing. Films with large spherulites show an exce llent charge stability, comparable and even superior to commercially a vailable Teflon-PTFE foils. PLD-PTFE enlarges the family of Teflon mat erials and may thus become interesting for potential miniaturized elec tret devices. (C) 1998 American Institute of Physics. [S0003-6951(98)0 4646-4].