A simple technique for estimating the slit width of a spectrometer fro
m the ratio of the observed (Delta nu(1/2))(R) and (Delta nu(1/4))(R)
of a Raman line profile was developed by calculating a set of correspo
nding values of Z = (Delta nu(1/4))(R)/(Delta nu(1/2))(R) and X = S/(D
elta nu(1/2))(R) based on the exact numerical evaluation of the Voigt
profile. This technique was applied to some selected Raman lines and w
as found to give accurate values of the slit width in almost all cases
where the slit distortion is appreciable and the band is isolated. An
other technique for calculating the fractional Lorentzian character fr
om the observed Raman spectra is also suggested. (C) 1997 by John Wile
y & Sons, Ltd.