ANALYSIS OF SPECTROSCOPIC SCANNING TUNNELING MICROSCOPE IMAGES

Authors
LI JT SCHNEIDER WD BERNDT R
Citation
Jt. Li et al., ANALYSIS OF SPECTROSCOPIC SCANNING TUNNELING MICROSCOPE IMAGES, Applied physics A: Materials science & processing, 66, 1998, pp. 167-169
Citations number
18
Categorie Soggetti
Physics, Applied
Journal title
Applied physics A: Materials science & processing → ACNP
ISSN journal
09478396
Volume
66
Year of publication
1998
Part
1
Supplement
S
Pages
167 - 169
Database
ISI
SICI code
0947-8396(1998)66:<167:AOSSTM>2.0.ZU;2-E
Abstract
Electron scattering from steps on the Ag(111) surface has been studied by spectroscopic scanning tunneling microscope (STM) images of the di fferential conductance (dI/dV). Modeling shows that near steps the fea tures of dI/dV deviate significantly from those of the underlying loca l density of states. These deviations are due to variations of the ver tical tip position which exponentially affect the tunneling barrier tr ansmission and, hence, dI/dV.