DYNAMIC SFM WITH TRUE ATOMIC-RESOLUTION ON ALKALI-HALIDE SURFACES

Citation
M. Bammerlin et al., DYNAMIC SFM WITH TRUE ATOMIC-RESOLUTION ON ALKALI-HALIDE SURFACES, Applied physics A: Materials science & processing, 66, 1998, pp. 293-294
Citations number
16
Categorie Soggetti
Physics, Applied
ISSN journal
09478396
Volume
66
Year of publication
1998
Part
1
Supplement
S
Pages
293 - 294
Database
ISI
SICI code
0947-8396(1998)66:<293:DSWTAO>2.0.ZU;2-#
Abstract
Large-amplitude dynamic force microscopy is used to study alkali halid e surfaces. The {001} cleavage faces of NaF, RbBr, LiF, KI and NaCl co uld be atomically resolved with excellent stability. In all cases the observed lattice periods correspond to the bulk lattice of equally cha rged ions. The resonance frequency shift and the atomic corrugation am plitude tend to increase after successive tip crashes. This behaviour is explained by analogy with scanning tunnelling microscopy. In additi on, the mean atomic corrugation is found to be comparable to the diffe rence between the anion and cation ionic radii.