SCANNING PROBE MICROSCOPY ON NEW DENTAL ALLOYS

Citation
B. Reusch et al., SCANNING PROBE MICROSCOPY ON NEW DENTAL ALLOYS, Applied physics A: Materials science & processing, 66, 1998, pp. 805-808
Citations number
8
Categorie Soggetti
Physics, Applied
ISSN journal
09478396
Volume
66
Year of publication
1998
Part
2
Supplement
S
Pages
805 - 808
Database
ISI
SICI code
0947-8396(1998)66:<805:SPMOND>2.0.ZU;2-K
Abstract
Surface analytical methods such as scanning force microscopy (SFM), sc anning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS) were used to determine the surface properties of amalgam substit utes as tooth filling materials. In particular the corrosion and the p assivation behavior of new gallium restorative materials were studied. To give relevant practical data, the measurements were performed with and without the alloys being stored in artificial saliva to simulate physiological oral conditions.