OPTIMIZATION OF LATERAL RESOLUTION IN MAGNETIC FORCE MICROSCOPY

Magnetic force microscopy (MFM) plays an important role in magnetic re cording research. It is not only suited for the study of magnetic head s and recording media, but is also a possible technique for ultrahigh- density bit writing. One of the key properties of this technique is th e geometric simplicity of the magnetic field-detecting element-which m akes it suitable for reaching very high lateral resolution. Starting f rom the tip transfer function (TTF), as derived in [1], a minimum dete ctable wavelength will be used as a measure for the lateral resolution of the instrument. This minimum detectable wavelength will determine the detector noise level in the instrument's configuration. The model of the minimum detectable wavelength is then used to optimize the tip- sample configuration geometrically as well as magnetically.