LATERAL FORCE MICROSCOPE AND PHASE IMAGING OF PATTERNED THIOL SELF-ASSEMBLED MONOLAYER USING CHEMICALLY-MODIFIED TIPS

Authors
SASAKI K KOIKE Y AZEHARA H HOKARI H FUJIHIRA M
Citation
K. Sasaki et al., LATERAL FORCE MICROSCOPE AND PHASE IMAGING OF PATTERNED THIOL SELF-ASSEMBLED MONOLAYER USING CHEMICALLY-MODIFIED TIPS, Applied physics A: Materials science & processing, 66, 1998, pp. 1275-1277
Citations number
15
Categorie Soggetti
Physics, Applied
Journal title
Applied physics A: Materials science & processing → ACNP
ISSN journal
09478396
Volume
66
Year of publication
1998
Part
2
Supplement
S
Pages
1275 - 1277
Database
ISI
SICI code
0947-8396(1998)66:<1275:LFMAPI>2.0.ZU;2-8
Abstract
A hydrophobic/hydrophilic patterned thiol self-assembled monolayer (SA M) was formed on a gold-coated flat Si substrate. The patterned SAM wa s imaged by two modes of atomic force microscopy with Si tips and chem ically modified tips. One is lateral force microscopy and the other is a phase mode. The two different domains on the sample were successful ly mapped by both modes. Higher contrast of the images was obtained by using HOOC-terminated tips in both modes.