Aa. Onischuk et al., EPR INVESTIGATION OF A-SI-H AEROSOL-PARTICLES FORMED UNDER SILANE THERMAL-DECOMPOSITION, Applied magnetic resonance, 15(1), 1998, pp. 59-94
Citations number
85
Categorie Soggetti
Spectroscopy,"Physics, Atomic, Molecular & Chemical
The dangling bond defects were investigated in a-Si:H particles formed
under silane thermal decomposition in flow reactor. EPR together with
hydrogen evolution method were used. The experimental results allowed
us to conclude that there are two kinds of dangling bond defects in a
-Si:H aerosol particles. The defects of the first kind are localized o
n the surface of interconnected microvoids and microchannels (surface
dangling bonds) and those of the second kind are embedded in amorphous
silicon network (volume dangling bonds). The thermal equilibration of
dangling bonds and temperature dependence of equilibrium dangling bon
d concentration were investigated. It was found that at temperatures >
400 K the dangling bond concentration N-s reversibly depends on sample
temperature. The Volume dangling bond concentration increases with te
mperature increasing (the effective activation energy of dangling bond
formation U> 0), and the surface dangling bond concentration decrease
s with temperature increasing (U < 0). It has been found that EPR line
is considerably asymmetric for samples with high hydrogen content and
for low hydrogen content the EPR line is weakly asymmetric. A conclus
ion was drawn that the asymmetry degree depends on amorphous silicon l
attice distortions. This conclusion has been confirmed by EPR spectra
simulations.