InSb nanocrystals embedded in SiO2 thin films were prepared by rf magn
etron cosputtering technique. The observation by transmission electron
microscope showed that InSb nanocrystals dispersed uniformly In SiO2
matrices. InSb nanocrystals with different sizes can be obtained by ch
anging the annealing condition. The average size of InSb nanocrystals
depended on annealing temperature and time, but not on the t(1/3) rule
s. X-ray photoelectron spectroscopy and X-ray diffraction were also ap
plied to the analyses of the composite thin films.