An electron cyclotron resonance assisted plasma with N-2 being the pla
sma source gas was employed to deposit hexagonal GaN on (0001) surface
of alpha-Al2O3 substrate. By special gas distributor, trimethgallium
was introduced into reactant zone. A 10x10 mm uniform GaN film was gai
ned with relatively low deposition temperature, 560 degrees C, and hig
h growth rate of 1.4 mu m/h. A good crystal microstructure was confirm
ed by its spectrum with full width at half maximum of 15 arcmin.