[101]ORIENTED PR0.7CA0.3-XSRXMNO3-DELTA THIN-FILMS PREPARED BY RF-MAGNETRON REACTIVE SPUTTERING

Thin films of manganite materials (Pr0.7Ca0.3-xSrxMnO3-delta) have bee n grown, from a sintered target with the same cationic composition, by rf reactive magnetron sputtering. The film and target compositions ha ve been verified as identical, within experimental errors, by energy-d ispersive scattering (EDS) analysis. It is shown for the first time, f rom X-ray and electron diffraction studies, that the films, grown on L aAlO3 or SrTiO3 substrates, are [101] oriented. Nanostructural studies show that the defects are the same as those observed in bulk material s but that the magnetic behavior is different (Curie temperature is de creased from 130 to 50K). From a structural point of view this differe nce in magnetic behavior is difficult to understand, but the role of t he oxygen content, the small grain size observed in such films, and th e strains induced by the substrate film interactions is discussed.