The adsorption and thermal decomposition of ethylsilane, diethylsilane
, triethylsilane, tetraethylsilane, dimethylsilane and di-isobutylsila
ne were studied on the Si(100)2 x 1 reconstructed surface using temper
ature-programmed desorption mass spectrometry and high-resolution elec
tron energy-loss spectroscopy. Ethylsilane, diethylsilane and di-isobu
tylsilane each adsorbs dissociatively onto the surface up to a saturat
ion coverage of approximately 0.25 ML. Thermal decomposition proceeds
via beta-hydride elimination. Ethylene and hydrogen desorption occurs
at 700 and 800 K, respectively, for ethylsilane and diethylsilane. Iso
butylene desorption is observed at 635 K, followed by hydrogen desorpt
ion at 800 K for di-isobutylsilane. Dimethylsilane adsorbs dissociativ
ely up to a saturation coverage of 0.25 ML. Thermal decomposition proc
eeds via dehydrogenation of the methyl groups. Hydrogen desorption is
observed at 800 K for low coverages with a 5-10 K peak shift to higher
temperatures for higher coverages. Triethylsilane adsorbs dissociativ
ely, but saturation coverage could not be established in these experim
ents. Thermal decomposition proceeds via P-hydride elimination, result
ing in the desorption of ethylene at 700 K and hydrogen at 800 K. Adso
rption of tetraethylsilane is not observed. For every precursor, excep
t tetraethylsilane, hydrogen adsorbs exclusively as the (2 x 1) monohy
dride. No adsorption of any of these precursors on the native SiO2 sur
face is observed at 100 K. (C) 1997 Elsevier Science B.V.