THERMOGRAVIMETRIC AND DIELECTRIC-RELAXATION SPECTROSCOPY OF A THIOSEMICARBAZIDE SCHIFF-BASE AND ITS METAL-COMPLEXES

Citation
Me. Kassem et al., THERMOGRAVIMETRIC AND DIELECTRIC-RELAXATION SPECTROSCOPY OF A THIOSEMICARBAZIDE SCHIFF-BASE AND ITS METAL-COMPLEXES, JOURNAL OF THERMAL ANALYSIS AND CALORIMETRY, 51(2), 1998, pp. 617-625
Citations number
15
Categorie Soggetti
Chemistry Analytical","Chemistry Physical
Journal title
JOURNAL OF THERMAL ANALYSIS AND CALORIMETRY
ISSN journal
13886150 → ACNP
Volume
51
Issue
2
Year of publication
1998
Pages
617 - 625
Database
ISI
SICI code
0368-4466(1998)51:2<617:TADSOA>2.0.ZU;2-E
Abstract
The thermal and dielectric spectroscopy of a thiosemicarbazide Schiff base and its nickel and palladium complexes were studied. The Perkin E lmer TGA7 thermal analysis technique was applied to study the effect o f the heating rate on the TG curve. A Hioki 3520 RLC tester was used t o measure the dielectric spectroscopy in the frequency range 10(2)-10( 5) HZ. The activation energies of the ligand and its complexes were de termined, and the d.c. and a.c, conductivities were estimated for the ligand and its Ni(II) complex. The results showed that the Ni(II) comp lex was present in a dimeric form, while the Pd(II) complex was presen t in a monomeric form. The insertion of a nickel atom increases the d. c. conductivity. The mechanism of conduction is discussed.