INFLUENCE OF DETECTION CONDITIONS ON NEAR-FIELD OPTICAL IMAGING

Citation
B. Hecht et al., INFLUENCE OF DETECTION CONDITIONS ON NEAR-FIELD OPTICAL IMAGING, Journal of applied physics, 84(11), 1998, pp. 5873-5882
Citations number
33
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
84
Issue
11
Year of publication
1998
Pages
5873 - 5882
Database
ISI
SICI code
0021-8979(1998)84:11<5873:IODCON>2.0.ZU;2-U
Abstract
The process of image formation in transmission mode scanning near-fiel d optical microscopy is analyzed both theoretically and experimentally . Changes in the dielectric and topographic properties of the sample i nfluence not only the total transmitted intensity, but also its angula r distribution in the far field. This opens up an additional source of optical information about the sample. Some of this additional informa tion is retrieved by separate but simultaneous detection of the radiat ion emitted at angles smaller (allowed light) and larger (forbidden li ght) than the critical angle of total internal reflection, respectivel y. Different experimental setups and their respective advantages are d iscussed. High resolution, constant height mode optical images of test structures are compared with theoretical predictions. Forbidden-light optical images frequently provide enhanced resolution and/or contrast as compared to allowed light images. For small phase objects, in cont rast to amplitude objects, a contrast reversal between forbidden and a llowed light images is observed. (C) 1998 American Institute of Physic s. [S0021-8979(98)02923-5]