LIMITS ON QUALITY FACTORS OF LOCALIZED DEFECT MODES IN PHOTONIC CRYSTALS DUE TO DIELECTRIC LOSS

Citation
T. Ueta et al., LIMITS ON QUALITY FACTORS OF LOCALIZED DEFECT MODES IN PHOTONIC CRYSTALS DUE TO DIELECTRIC LOSS, Journal of applied physics, 84(11), 1998, pp. 6299-6304
Citations number
19
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
84
Issue
11
Year of publication
1998
Pages
6299 - 6304
Database
ISI
SICI code
0021-8979(1998)84:11<6299:LOQFOL>2.0.ZU;2-2
Abstract
The spectral widths of defect modes localized at line defects formed i n a two-dimensional photonic crystal composed of a square lattice of d ielectric cylinders were analyzed theoretically. The transmission spec tra calculated by the layer-doubling method based on the vector-cylind rical- wave expansion of the internal field showed a rapid decrease of the spectral width with increasing number of the lattice layers when the dielectric loss is absent. Quality factors larger than 10(7) were predicted for the total lattice layers of 18. However, the numerical e valuation of the decay constant of the defect modes due to the imagina ry part of the dielectric constant showed that the actual quality fact or is limited by the dielectric loss. The calculated widths agreed qua litatively with the experimental observations by Lin et al. [Appl. Phy s. Lett. 68, 3233 (1996)]. (C) 1998 American Institute of Physics. [S0 021-8979(98)07623-3].