A. Dargys et J. Kundrotas, IMPACT IONIZATION OF EXCITONS BY HOT CARRIERS IN QUANTUM-WELLS, Semiconductor science and technology (Print), 13(11), 1998, pp. 1258-1261
Dissociation of free excitons into electrons and holes, due to collisi
ons between the excitons and charge carriers accelerated by an in-plan
e electric field in a multiple quantum well structure, is considered.
We found that at normally used 2D excitonic concentrations the impact
ionization process is rather strong and dominates over the exciton for
mation process at electric fields of the order of a few hundred V cm(-
1).