Yc. Wang et al., EFFECT OF TEMPERATURE ON ELECTRON-ATTACHMENT TO AND NEGATIVE-ION STATES OF CCL2F2, The Journal of chemical physics, 109(19), 1998, pp. 8304-8310
The effect of temperature on electron attachment to dichlorodifluorome
thane (CCl2F2) has been investigated for temperatures up to 500 K and
for mean-electron energies from thermal to 1.0 eV using an electron sw
arm method. The measurements were made in mixtures of CCl2F2 with nitr
ogen. The electron attachment rate constant increases with temperature
over the entire temperature and mean-electron energy range investigat
ed. The variation of the thermal value of the electron attachment rate
constant with temperature compares well with earlier measurements of
this quantity and shows an increase by a factor of 10 when the tempera
ture is raised from 300 to 500 K. From a comparison of published data
on the electron affinity, electron attachment using the swarm method,
electron attachment using the electron beam method, electron scatterin
g, electron transmission, indirect electron scattering, and related ca
lculations, the lowest negative ion states of CCl2F2 have been identif
ied with average positions as follows: a(1)(C-Cl sigma) at +0.4 eV an
d -0.9 eV, b(2)(C-Cl sigma) at -2.5 eV, a(1)(C-F sigma*) at -3.5 eV,
and b(1)(C-F sigma) at -6.2 eV; an electron-excited Feshbach resonanc
e is also indicated at -8.9 eV. (C) 1998 American Institute of Physics
. [S0021-9606(98)02043-1].