T. Chao, M. et C. Fu, James, The reliability of a large series system under Markov structure, Advances in applied probability , 23(4), 1991, pp. 894-908
Let Y1, · ··, Yn be a finite Markov chain and let f be a binary value function defined over the state space of the Y's. We study the reliability of general series system having the structure function . (Y) = min {f(Y1), · ··, f(Yn)} and show that, under certain regularity conditions, the reliability of the system tends to a constant c (1 . c . 0), where c often has the form c = exp {..}.