Ab. Gilman et al., MODIFICATION OF POLYIMIDE FILMS OF DIFFERENT THICKNESS IN A DIRECT-CURRENT DISCHARGE, High energy chemistry, 32(6), 1998, pp. 427-429
Modification of polyimide films of different thickness (25, 40, and 50
mu m) in a de discharge in an air atmosphere was examined. It was fou
nd that polyimide film thickness had no effect on the contact angle (t
heta) with the same conditions of sample treatment and storage. The su
rface potential (phi) significantly depended on the thickness of modif
ied films: the greater the film thickness, the greater the absolute va
lue of phi, which is negative in sign. The permittivity (epsilon) for
polyimide samples of different thickness was measured experimentally.
It was found that epsilon = 3.2 +/- 0.2, regardless of the conditions
under which the films were modified and stored. The surface charge den
sity (Q) was calculated using the formula for a plane capacitor and th
e experimental epsilon values. A correlation between the theta and Q v
alues for polyimide films of different thickness was found.