Sw. Kim et al., REVERSE ENGINEERING - HIGH-SPEED DIGITIZATION OF FREE-FORM SURFACES BY PHASE-SHIFTING GRATING PROJECTION MOIRE TOPOGRAPHY, International journal of machine tools & manufacture, 39(3), 1999, pp. 389-401
A new digitization method is presented for automatic acquisition of ge
ometric information on free-form surfaces for the sake of reverse engi
neering. Principles of grating projection moire topography are utilize
d with emphasis on enhancing the measuring resolution by incorporating
phase-shifting fringe analysis, The measuring range and resolution ca
n be readily adjusted to suit the object size to be measured, simply b
y varying the spatial line pitch of the moire gratings. In addition, n
o time-consuming beam scanning is required in the measurement, keeping
the measuring time relatively low as compared with other existing tec
hniques. Experimental results demonstrate that the three-dimensional c
oordinate data of 640 X 480 points can be attained within 5 seconds ru
n on an IBM PC 586, with measuring resolutions of 0.1 mm down to 0.001
mm. (C) 1998 Elsevier Science Ltd. All rights reserved.