ANNEALING EFFECT FOR LAXC60 THIN-FILMS

Citation
T. Terui et al., ANNEALING EFFECT FOR LAXC60 THIN-FILMS, Thin solid films, 331(1-2), 1998, pp. 113-116
Citations number
16
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
331
Issue
1-2
Year of publication
1998
Pages
113 - 116
Database
ISI
SICI code
0040-6090(1998)331:1-2<113:AEFLT>2.0.ZU;2-C
Abstract
Numerous studies on metal-doped C-60 compounds had been done since the discovery of superconducting C-60 compounds. It is interesting to stu dy physical properties of trivalent-meta-doped C-60. We examined La-do ped C-60 thin films fabricated by layer-by-layer (LBL) deposition with a multi-source evaporation system. The physical properties of LaxC60 depend on the diffusion of La atoms in the film, so we studied the eff ect of annealing. The crystal structure and morphology of LaxC60 thin films were examined by X-ray diffraction and AFM and electronic struct ure was also examined by UPS. We found that annealing promotes orienta tion of the crystal. UPS spectra showed the change depends on the conc entration of La atoms. Moreover, the spectrum of annealed thin film wa s quite different from that of as-deposited thin film. (C) 1998 Publis hed by Elsevier Science S.A. All rights reserved.