ENERGY RESOLUTION OF A MULTILAYER SEMICONDUCTOR SPECTROMETER

A method for determining energy resolution of the two-arm semiconducto r spectrometer is proposed. The setup is composed of two telescopes. E ach of them contains two Si(Au)- and 14 Si(Li)-detectors with a total sensor thickness of 43 mm. The telescopes provide precision spectromet ry (Delta E/E similar or equal to 0.5%) of long-range charged particle s (p, d, and t) with energies up to similar to 100 MeV. The factors af fecting the setup resolution are considered. The analytical expression s derived for the components of the total energy resolution permit sim ple and correct preliminary estimations of the resolution. The agreeme nt of the measured energy resolution is demonstrated by calculations.