POSSIBILITIES AND LIMITATIONS OF I-DDQ TESTING IN SUBMICRON CMOS

I-DDQ Testing is a well accepted testing approach based on the observa tion of the quiescent current consumption. Its growing industrial impl ementation is based on the possibility of detecting defects which esca pe other more traditional testing methods, However, its application co sts are higher and its effectiveness in deep submicron technologies ma y decrease if the current trend of leakage increase is not stopped by creative innovation.