FIELD-ION MICROSCOPE EXAMINATION OF THE ACTION OF AN INTENSE ION FLUXFROM A LASER-PLASMA ON TUNGSTEN

Authors
SUVOROV AL CHEBLUKOV YN BOBKOV AF ZAITSEV SV LATYSHEV SV SKOROKHODOV EN STEPANOV AE
Citation
Al. Suvorov et al., FIELD-ION MICROSCOPE EXAMINATION OF THE ACTION OF AN INTENSE ION FLUXFROM A LASER-PLASMA ON TUNGSTEN, Technical physics letters, 24(11), 1998, pp. 888-890
Citations number
14
Categorie Soggetti
Physics, Applied
Journal title
Technical physics letters → ACNP
ISSN journal
10637850
Volume
24
Issue
11
Year of publication
1998
Pages
888 - 890
Database
ISI
SICI code
1063-7850(1998)24:11<888:FMEOTA>2.0.ZU;2-7
Abstract
Results are presented of field ion microscope examinations of the stru cture of tungsten samples exposed to the action of a high-intensity io n flux (similar to 10(22) ions/cm(2) . s) from a lead laser plasma. It was observed that the surface layer becomes amorphized and the defect spectrum was established. The limiting mechanical properties of irrad iated tips were determined. Promising directions for further research are indicated. (C) 1998 American Institute of Physics. [S1063-7850(98) 02311-8].