SUBANGSTROM RESOLUTION BY UNDERFOCUSED INCOHERENT TRANSMISSION ELECTRON-MICROSCOPY

Authors
NELLIST PD PENNYCOOK SJ
Citation
Pd. Nellist et Sj. Pennycook, SUBANGSTROM RESOLUTION BY UNDERFOCUSED INCOHERENT TRANSMISSION ELECTRON-MICROSCOPY, Physical review letters, 81(19), 1998, pp. 4156-4159
Citations number
22
Categorie Soggetti
Physics
Journal title
Physical review letters → ACNP
ISSN journal
00319007
Volume
81
Issue
19
Year of publication
1998
Pages
4156 - 4159
Database
ISI
SICI code
0031-9007(1998)81:19<4156:SRBUIT>2.0.ZU;2-4
Abstract
It is quantitatively explained why incoherent transmission electron mi croscope imaging is extremely robust to the effects of chromatic aberr ation, which usually limits the resolution in the conventional coheren t mode of imaging. Combining this robustness with using underfocus to counter the effects of spherical aberration, we demonstrate subangstro m lattice resolution and information transfer to 0.078 nm.