EFFECT OF SURFACE STEPS ON THE PLASTIC THRESHOLD IN NANOINDENTATION

Citation
Jd. Kiely et al., EFFECT OF SURFACE STEPS ON THE PLASTIC THRESHOLD IN NANOINDENTATION, Physical review letters, 81(20), 1998, pp. 4424-4427
Citations number
16
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
81
Issue
20
Year of publication
1998
Pages
4424 - 4427
Database
ISI
SICI code
0031-9007(1998)81:20<4424:EOSSOT>2.0.ZU;2-7
Abstract
Using interfacial force microscopy and passivated Au surfaces, we have investigated the effect of surface steps on the initiation of plastic yield by performing nanoindenrations as a function of separation betw een the probe and neighboring steps. The mean stress at yield was 30%- 45% lower at a step than in regions foe of surface defects. In additio n, the spatial extent of the step's influence was found to be approxim ately 3 times the contact radius at the yield threshold, suggesting th at yield processes are not limited to the region in contact with the i ndenter.