Ch. Wan et al., 2 NEW MEASUREMENT METHODS FOR EXPLICIT DETERMINATION OF COMPLEX PERMITTIVITY, IEEE transactions on microwave theory and techniques, 46(11), 1998, pp. 1614-1619
This paper presents two new measurement methods for explicit determina
tion of complex permittivity. For the first time, these methods combin
e the explicit algorithm with a simplified yet accurate error-correcti
on technique. The combination is made possible by the use of one sampl
e of single length and another of double length. For low-loss material
s, one of the methods is valid for any sample length and independent o
f sample positions, but needs a prior estimate of the permittivity, wh
ile the other requires no such estimate, but avoidance of the single l
ength being multiples of half-wavelength in the sample, For high-loss
materials, both methods may need the estimate, Advantages of each meth
od can be taken if both methods are used simultaneously. Experimental
results from the proposed methods show excellent agreement with those
from a recent iterative method. Errors arising from small deviations f
rom the double length are also analyzed and presented. The validity, e
xplicitness, and simple error-correction capability make the new metho
ds very useful.