2 NEW MEASUREMENT METHODS FOR EXPLICIT DETERMINATION OF COMPLEX PERMITTIVITY

Citation
Ch. Wan et al., 2 NEW MEASUREMENT METHODS FOR EXPLICIT DETERMINATION OF COMPLEX PERMITTIVITY, IEEE transactions on microwave theory and techniques, 46(11), 1998, pp. 1614-1619
Citations number
15
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
00189480
Volume
46
Issue
11
Year of publication
1998
Part
1
Pages
1614 - 1619
Database
ISI
SICI code
0018-9480(1998)46:11<1614:2NMMFE>2.0.ZU;2-1
Abstract
This paper presents two new measurement methods for explicit determina tion of complex permittivity. For the first time, these methods combin e the explicit algorithm with a simplified yet accurate error-correcti on technique. The combination is made possible by the use of one sampl e of single length and another of double length. For low-loss material s, one of the methods is valid for any sample length and independent o f sample positions, but needs a prior estimate of the permittivity, wh ile the other requires no such estimate, but avoidance of the single l ength being multiples of half-wavelength in the sample, For high-loss materials, both methods may need the estimate, Advantages of each meth od can be taken if both methods are used simultaneously. Experimental results from the proposed methods show excellent agreement with those from a recent iterative method. Errors arising from small deviations f rom the double length are also analyzed and presented. The validity, e xplicitness, and simple error-correction capability make the new metho ds very useful.