AN ALTERNATIVE METHOD FOR END-EFFECT CHARACTERIZATION IN SHORTED SLOTLINES

In this paper, we propose an alternative method to characterize the en d effects in shorted slotlines. Using a commercial software to model t he transition, a simple mathematical expression of the end impedance, valid for a given substrate family and in a wide frequency domain, was achieved. Several dielectric substrates were considered and the obtai ned results were compared with experimental ones. A correct agreement was observed. This approach can also be useful in more complex simulat ions relative to multilayer structures.