TRANSIENT-RESPONSE TESTING OF ANALOG COMPONENTS IN MIXED-SIGNAL SYSTEMS - A REVIEW

Authors
TAYLOR D
Citation
D. Taylor, TRANSIENT-RESPONSE TESTING OF ANALOG COMPONENTS IN MIXED-SIGNAL SYSTEMS - A REVIEW, IEE proceedings. Circuits, devices and systems, 145(5), 1998, pp. 314-318
Citations number
21
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
IEE proceedings. Circuits, devices and systems → ACNP
ISSN journal
13502409
Volume
145
Issue
5
Year of publication
1998
Pages
314 - 318
Database
ISI
SICI code
1350-2409(1998)145:5<314:TTOACI>2.0.ZU;2-M
Abstract
Transient response testing has developed over the last few years from a benchtop characterisation technique into a very powerful production test technique for all types of analogue components in mixed-signal el ectronic systems. The author reviews recent progress in this area, sum marising results from both simulations and work on real circuits, then briefly describes the directions in which current research work is pr ogressing.