BULK DEFECTS IN GRAPHITE OBSERVED WITH A SCANNING TUNNELING MICROSCOPE

Authors
Citation
J. Osing et Iv. Shvets, BULK DEFECTS IN GRAPHITE OBSERVED WITH A SCANNING TUNNELING MICROSCOPE, Surface science, 417(1), 1998, pp. 145-150
Citations number
21
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
417
Issue
1
Year of publication
1998
Pages
145 - 150
Database
ISI
SICI code
0039-6028(1998)417:1<145:BDIGOW>2.0.ZU;2-Y
Abstract
Scanning tunnelling microscopy (STM) has been used to observe a misori entation of a graphite layer that is buried several layers below the s urface. A nanoscale periodic pattern superimposed on the atomic graphi te lattice has been observed. The appearance of the superperiodic feat ures in the STM image is shown to be clearly tip-sample distance depen dent. We suggest that a subsurface misorientation, several layers deep , causes a nanoscale moire pattern, which can propagate to the surface and contributes to the STM image. This result is rather surprising as STM is thought to be unable to image bulk defects. (C) 1998 Elsevier Science B.V. All rights reserved.