We report a study of recovery dynamics, followed by in situ, resistivi
ty measurements after 100 MeV oxygen ion irradiation, in cold rolled F
e at 300 K. Scaling behavior with microstructural density and temperat
ure of the sample have been used to establish stress-induced defects f
ormed during irradiation as a new type of sink. The dynamics after irr
adiation has been shown to be due to migration of defects to two types
of sinks, i.e. stress-induced defects as variable sinks and internal
surfaces as fixed sinks. Experimental data obtained under various expe
rimental conditions have been fitted to theoretical curves. The parame
ters thus obtained from fitting are employed to establish the effect o
f electronic energy loss and temperature on the recovery dynamics and
stress associated with variable sinks.