ANNEALING OF DEFECTS IN FE AFTER MEV HEAVY-ION IRRADIATION

Authors
Citation
G. Aggarwal et P. Sen, ANNEALING OF DEFECTS IN FE AFTER MEV HEAVY-ION IRRADIATION, Europhysics letters (Print), 44(4), 1998, pp. 471-477
Citations number
16
Categorie Soggetti
Physics
Journal title
ISSN journal
02955075
Volume
44
Issue
4
Year of publication
1998
Pages
471 - 477
Database
ISI
SICI code
0295-5075(1998)44:4<471:AODIFA>2.0.ZU;2-Q
Abstract
We report a study of recovery dynamics, followed by in situ, resistivi ty measurements after 100 MeV oxygen ion irradiation, in cold rolled F e at 300 K. Scaling behavior with microstructural density and temperat ure of the sample have been used to establish stress-induced defects f ormed during irradiation as a new type of sink. The dynamics after irr adiation has been shown to be due to migration of defects to two types of sinks, i.e. stress-induced defects as variable sinks and internal surfaces as fixed sinks. Experimental data obtained under various expe rimental conditions have been fitted to theoretical curves. The parame ters thus obtained from fitting are employed to establish the effect o f electronic energy loss and temperature on the recovery dynamics and stress associated with variable sinks.