An incidence model is formulated from the basic principles of radiatio
n heat transfer to predict the light intensity profile inside a photoc
atalytic monolith reactor, where a light-absorbing and light-reflectin
g catalytically active thin film is coated on the inner walls of monol
ith channels of either circular or square cross section. A diffuse ext
ernal light source and diffusely reflecting wall coatings were assumed
. The mathematical model representation of the light Bur distribution
to the monolith wall and through the ross section of the monolith chan
nel take the form of integral equations. In dimensionless form, these
equations reveal that, for a given channel type, light intensity profi
les are controlled by channel aspect ratio and film reflectivity. The
equations were solved numerically using Gauss-Legendre quadrature to g
ive quantitative estimates of the radiation intensity profile down the
length of the monolith channel for a specified incident light intensi
ty distribution at the entrance of the channel and an assumed thin fil
m reflectivity. Experimental cross-sectional light intensity profiles
for square channeled, uncoated ceramic monoliths with two different ce
ll densities confirmed the prediction of the model that dimensionless
profiles are not dependent on absolute channel dimensions, but rather
are uniquely determined by the channel aspect ratio. Experimental inte
nsity data for titania-coated monoliths were well described by model p
redicted profiles assuming an average reflectivity of 40%. For identic
al aspect ratio channels, model predictions reveal that the light inte
nsity profiles for square and circular channels are quite similar. Mod
el predictions indicate that radiation field gradients are large, with
relatively little light penetrating beyond a length equivalent to thr
ee channel widths. This prediction implies that, for monoliths with ty
pical commercial aspect ratios, a large fraction of the coated channel
wall is not effectively irradiated. (C) 1998 Elsevier Science Ltd. Al
l rights reserved.