IMAGING THE EDGE OF A HE-4 PREWETTING FILM ON A CESIUM METAL, SURFACE

Citation
X. Muller et al., IMAGING THE EDGE OF A HE-4 PREWETTING FILM ON A CESIUM METAL, SURFACE, Journal of low temperature physics, 113(5-6), 1998, pp. 823-828
Citations number
19
Categorie Soggetti
Physics, Applied
ISSN journal
00222291
Volume
113
Issue
5-6
Year of publication
1998
Pages
823 - 828
Database
ISI
SICI code
0022-2291(1998)113:5-6<823:ITEOAH>2.0.ZU;2-4
Abstract
The edge of a metastable He-4 prewetting film on a cesium metal surfac e is investigated using polarization interference microscopy. This tec hnique images the local gradient of the coverage through its optical t hickness. The cesium metal is a film evaporated on a polished copper s ubstrate. A liquid helium film is deposited on the surface through rai sing and lowering the bulk liquid surface. Its edge is clearly observe d for temperatures below 1.6 K. The apparent optical thicknesses of th e films, larger theta what is expected for a normal saturated film, re main to be explained.